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이름 (주)지엘코퍼레이션 이메일 jhcho@glteam.com
작성일 2014-11-25 조회수 2078
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Spectral Voxels Reconstructed from Simultaneous EELS and EDS Spectrum Image Tomography
 
 

Graz reconstructs spectral voxels from simultaneous EELS and EDS spectrum image tomography

Transmission electron microscopy (TEM) has long been limited to supplying only projections of three-dimensional objects limiting the information that can be obtained to two dimensions.  Tilt series tomography provides 3D information, but for compositional tomography, the information is only qualitative.
Researchers at the Graz Center for Electron Microscopy and the University of Leoben in Austria utilized tilt-series scanning TEM (STEM) tomography with simultaneous low-loss EELS, core-loss EELS and EDS spectrum imaging to create three-dimension compositional maps.  Using advanced processing techniques,  they went a step further to create voxel spectra of the 3D object.  The voxel spectra allow data extraction to be perform post reconstruction open whole new avenues of analysis.  The outstanding nano-chemical reconstructions of a Al-5 wt.% Si with 50 ppm Na and 6100 ppm Yb attested to the power of the technique.
Video
Contributing to the success of the project were the speed and efficiency of the GIF Quantum EELS system (Model 966) and the High-Speed Spectrum Imaging package (Models 777.U1/U2/U3) from Gatan.  The group also used prototype, model based EELS and EDS software in part of the data analysis.  This prototype software will be a standard features of the new GMS 3 analysis package.
While advanced hardware can help any project, it was the vision, ingenuity and perseverance of the research team that made this remarkable achievement possible.  Advanced publication is available online. Nanoscale voxel spectroscopy by simultaneous EELS and EDS tomography; Haberfehlner, Orthacker, Albu, Li and Kothleitner; Nanoscale, 2014, Advance Article.

Video : http://vimeo.com/110841729

 
가탄 Gatan 지엘 지엘코퍼레이션 GL Corporation 이온 밀링 이온 밀러 샘플 시료 시편 sample sample preparation specimen preparation specimen 과학 전자현미경 투과전자현미경 주사전자현미경 현미경학회 KSEM SEM TEM 현미경 광학현미경 PIPS II PECS II ILION II SOLARUS 핍스 펙스 솔라루스 솔라러스 일리언 일리온 아르곤 가스 페닝 이온 건 Penning ion gun 시편 전처리 시료 전처리 장비
알곤 Argon
이전글 Reason of Dimpling
다음글 EELS mapping breakthrough: Extended area and energy range obtained with GIF Quantum