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이름 (주)지엘코퍼레이션 이메일 jhcho@glteam.com
작성일 2014-10-20 조회수 7647
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Optimizing STEM Spectrum Image Acquisition for High-Speed Analysis Webinar

Optimizing STEM Spectrum Image Acquisition for High-Speed Analysis Webinar

Join us for this webinar on October 27, 2014. For your convenience, this webinar will be given in the morning and afternoon on October 27.

STEM EELS spectrum imaging can reveal composition and chemical changes at the nano-scale and even the atomic scale in many cases.  To reveal this information, the researcher needs to optimize not only the spectrometer, but also the sample and the STEM configuration.  In this webinar, we will discuss how to optimize the configuration of the STEM and EELS system for high-speed spectrum imaging analysis.  We will review the requirements of EELS camera and spectrometer settings needed to push the limits of spectrum image performance.

Space is limited. Reserve your webinar seat now at one of these two times on October 27, 2014:
System Requirements
  • PC-based attendees. Required: Windows® 8, 7, Vista, XP or 2003 Server
  • Macintosh®-based attendees. Required: Mac OS® X 10.6 or newer
  • Mobile attendees. Required: iPhone®, iPad®, Android™ phone or Android tablet
 
Image: EELS colorized maps of Ti L at 456 eV in green, Fe L at 708 eV in amber, La M at 832 eV in blue, Cu L at 931 eV in purple and Sr L at 1940 eV in red. Data and TEM support courtesy of Dr. Phil Rice and Dr. Teya Topuria, IBM Almaden Research Center.
 
지엘코퍼레이션 시편 가탄 이온밀러 이온 밀링 샘플 전처리 시편 전처리 sample preparation specimen gatan ion milling ion miller polishing 폴리싱 글라이던 dimple grinder pips pecs ilion solarus 솔라루스 펙스 핍스 일리언 전처리 장비 지엘 전자현미경 SEM TEM 주사전자현미경 투과전자현미경 광학 현미경 정밀 시편처리
이전글 Gatan 웹사이트 리뉴얼
다음글 Gatan 685 PECS II 출시