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이름 (주)지엘코퍼레이션 이메일 jhcho@glteam.com
작성일 2017-01-05 조회수 712
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10th Annual FIB-SEM Workshop

10th Annual FIB-SEM Workshop

The 2017 FIB-SEM Workshop will occur at the Gaithersburg campus of the National Institute of Standards and Technology (NIST).  The workshop program is a full day of presentations and posters by FIB users, plus vendors highlighting new FIB applications and the latest technology. There will be plenty of opportunities for informal discussion of new techniques and applications with fellow FIB users.
As an industry-leader in electron micoscropy instrumentation and software forFIB specimen preparation, Gatan is sponsoring the 2017 FIB-SEM Workshop and will have our team of engineers and sales managers to discuss your application needs. Please visit the Gatan table or contact delswick@gatan.comto arrange an appointment.
Thursday, March 2, 2017
8:00 am - 5:00 pm
National Institute of Standards and Technology
100 Bureau Drive
20899 Gaithersburg , MD
United States
 
(주)지엘코퍼레이션 Gatan 가탄 microPREP 레이저 밀링 장비 레이저 시편 처리 장비 sample preparation ion milling Gatan 장비 PIPS II PECS II Ilion II SOLARUS precision etching coating system TEM FIB Plasma cleaner jhcho@glteam.com
 
이전글 STEMx: 4D STEM for your Gatan in-situ camera
다음글 EELS & EFTEM Analysis Workshop November 2016