The 2017 FIB-SEM Workshop will occur at the Gaithersburg campus of the National Institute of Standards and Technology (NIST).  The workshop program is a full day of presentations and posters by FIB users, plus vendors highlighting new FIB applications and the latest technology. There will be plenty of opportunities for informal discussion of new techniques and applications with fellow FIB users.

As an industry-leader in electron micoscropy instrumentation and software forFIB specimen preparation, Gatan is sponsoring the 2017 FIB-SEM Workshop and will have our team of engineers and sales managers to discuss your application needs. Please visit the Gatan table or contact delswick@gatan.comto arrange an appointment.