자유게시판

이름 (주)지엘코퍼레이션 이메일 aijeong@glteam.com
작성일 2017-05-26 조회수 615
파일첨부
제목
STEMx: 4D STEM for your Gatan in-situ camera
 

STEMx: 4D STEM for your Gatan in-situ camera

Introducing STEMx™, a 4D STEM diffraction system that collects data through hardware synchronization with Gatan’s in-situ cameras. By leveraging the high spatial and temporal resolution of the OneView® IS and K2® IS cameras, STEMx enables a wide variety of 4D STEM experiments, including strain mapping, indexing, orientation mapping, virtual apertures, and differential phase contrast.

  • Adds powerful 4D STEM abilities
  • Enables high-resolution, 4D STEM diffraction studies over large areas
  • Delivers high-impact results within minutes
Advantages: 

Introducing STEMx™, a 4D STEM diffraction system that collects data through hardware synchronization with Gatan’s in-situ cameras. By leveraging the high spatial and temporal resolution of the OneView® IS and K2® IS cameras, STEMx enables a wide variety of 4D STEM experiments, including strain mapping, indexing, orientation mapping, virtual apertures, and differential phase contrast.

  • Leverage your existing Gatan in-situ camera for new 4D STEM applications
  • Scan large sample areas with high diffraction space resolution
  • Streamline your workflow for advanced applications
  • Examine preliminary results in <10 min

Once a diffraction pattern is generated for each data point, a single, interactive Gatan Microscopy Suite® (GMS) 3 display enables you to view and manipulate all the information in a 4D STEM diffraction cube; including diffraction planes or individual diffraction patterns at each pixel location. STEMx is then able to process these large datasets within minutes using data size reduction methods that comprise of binning in four dimensions, sub-sampling in the spatial domain, or selecting a small region of interest. By consolidating both acquisition and analysis into GMS 3, not only can you quickly analyze and assess results at the microscope, but immediately decide whether to modify acquisition parameters or capture a new dataset.

 

 

 

 

이전글 Gatan electron microscopy web seminar
다음글 10th Annual FIB-SEM Workshop