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이름 (주)지엘코퍼레이션 이메일 aijeong@glteam.com
작성일 2017-07-11 조회수 518
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Gatan electron microscopy web seminar

You are invited to join the following Gatan electron microscopy web seminar:

  
What 4D STEM experiments enabled by high-speed direct electron detectors
When Jul 19 2017 8:00 AM - 9:00 AM (PDT)

Traditional scanning transmission electron microscopy (STEM) detectors are large, single pixels that integrate a subset of the transmitted electron beam signal scattered from each electron probe position. These transmitted signals are extremely rich in information, containing localized information on sample structure, composition, phonon spectra, 3D defect crystallography, and more. Conventional STEM imaging experiments record only 1 – 2 values per probe position, throwing away most of the diffracted signal information. With the introduction of extremely high-speed direct electron detectors, we can now record a full image of the diffracted electron probe at each position, producing a four-dimensional dataset we refer to as a 4D STEM experiment.

In this talk, the challenges and opportunities created by 4D STEM will be discussed. The experiments that will be covered:

  • Mapping out local structure and composition by matching the experimental patterns to diffraction simulations
  • Local strain measurements over a very large field of view using nanobeam electron diffraction
  • Virtual dark-field imaging using arbitrary detectors
  • Phase contrast imaging methods in STEM, such as ptychography, MIDI-STEM, and multibeam STEM holography
  • Fluctuation electron microscopy

Presenter

Colin Ophus

Molecular Foundry, Berkeley Lab

To attend this web seminar, you must first register for it by clicking on the enrollment link below. Once you have registered, you will receive an email message confirming your enrollment status and information that you need to join the event.

See you online soon!

이전글 4D STEM experiments enabled by high-speed direct electron detectors
다음글 STEMx: 4D STEM for your Gatan in-situ camera